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. 2012 May 28;370(1967):2433–2447. doi: 10.1098/rsta.2011.0444

Figure 1.

Figure 1.

The physical characterization of nanoporous silica thin films: (a) STEM plane view of nanoporous silica film; (b) TEM plane view; (c) XRD pattern; (d) FTIR spectrum; (e) adsorption/desorption isotherm; and (f) pore size distribution. (Online version in colour.)