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. 2012 Mar 17;19(Pt 3):381–387. doi: 10.1107/S0909049512005043

Figure 3.

Figure 3

(a) XBIC image of the downstream diamond detector showing uniform response over the entire device (−50 V applied to the exit side of the diamond). The detector is rotated to avoid artifacts arising from the scan direction. The dark regions are caused by the electrical clips making contact with the platinum pads and by the phosphor-bronze clamp. The data are normalized to the expected value for full charge collection. (b) The sum of the current on the four pads versus the applied bias. The detectors are operated above the saturation region where there is full collection of the generated charge carriers. (c) Position calibration performed at beamline X28C.