Bruker P4 diffractometer	1541 reflections with I > 2σ(I)
Radiation source: X-ray	Rint = 0.062
Graphite monochromator	θmax = 25.0°, θmin = 2.3°
2θ/ω scans	h = −9→3
Absorption correction: ψ scan (XSCANS; Siemens, 1996)	k = −10→10
Tmin = 0.650, Tmax = 0.688	l = −16→16
5766 measured reflections	2 standard reflections every 48 reflections
3493 independent reflections	intensity decay: 14%