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. 2011 Sep 22;19(20):19627–19642. doi: 10.1364/OE.19.019627

Fig. 3.

Fig. 3

Relative standard deviation of the reflectance provided by discretizing the results of a cMC simulation for μa = 0.1mm−1 and μ′s = 1mm−1 using (a) 200 × 200 EFD bins, (b) 200 × 200 EWD bins, (c) 250 × 1000 EWD bins.