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. 2011 Dec 7;9(71):1318–1324. doi: 10.1098/rsif.2011.0688

Figure 3.

Figure 3.

(a) Atomic force microscope (AFM) topography image of the focused ion beam (FIB)-milled rectangular beams exposed at the anterior surface of the limpet tooth. (b) Schematic showing the mechanical test configuration used to bend individual FIB-milled limpet tooth beams using AFM mechanical testing. (Online version in colour.)