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. 2011 Jul 19;5(3):034102–034102-12. doi: 10.1063/1.3608138

TABLE I.

Thickness of PEMs deposited on silanized silicon surfaces. From the generated AFM scans, the height of step (mean values ± SD) is presented.

  PEI PEI/DSS/PEI PEI/(PEI/DSS) × 2
HMW, pH 9.2 3.9 ± 2.1 15.4 ± 3.5 24.4 ± 4.5
HMW, pH 6 3.2 ± 1.2 6.0 ± 1.0 6.7 ± 1.4
LMW, pH 9.2 5.3 ± 1.6 12.9 ± 1.4 19.3 ± 2.3
LMW, pH 6 1.9 ± 1.5 7.3 ± 1.8 7.8 ± 0.6