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. Author manuscript; available in PMC: 2012 Jun 1.
Published in final edited form as: IEEE Trans Ultrason Ferroelectr Freq Control. 2011 Aug;58(8):1658–1668. doi: 10.1109/TUFFC.2011.1993

Fig. 10.

Fig. 10

Setup for testing the TIA transimpedance characteristics. The pad capacitance, Cpad, does not have an effect on the measured transimpedance because the CCMUT is located after the pad.