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. Author manuscript; available in PMC: 2012 Jun 1.
Published in final edited form as: IEEE Trans Ultrason Ferroelectr Freq Control. 2011 Aug;58(8):1658–1668. doi: 10.1109/TUFFC.2011.1993

Fig. 8.

Fig. 8

The two noise terms in (4) with respect to RCMUT. The y-scale is drawn in log scale. This plot shows that for higher RCMUT values the total noise does not depend on the CMUT equivalent resistance.