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. 2011 Nov 3;470(7):1885–1894. doi: 10.1007/s11999-011-2155-9

Fig. 3.

Fig. 3

A graph shows severity of corrosion of Co-Cr-Mo and Ti devices as a function of percentage of devices showing no corrosion (severity of 0) through to severe corrosion (severity of 4). Time in situ for the Co-Cr-Mo and Ti devices is depicted on the second y axis. Despite a shorter implantation time, a greater degree of degradation is seen in the Co-Cr-Mo devices than in the Ti-based devices.