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. Author manuscript; available in PMC: 2012 Jun 7.
Published in final edited form as: IEEE J Sel Top Quantum Electron. 2012 May 1;18(3):1094–1099. doi: 10.1109/JSTQE.2011.2161758

Fig. 1.

Fig. 1

Three image acquisition formats for OCM: (a) point scanning; (b) line scanning, and (c) full-field. The shaded dots show the illumination patterns and the dashed arrows show the scanning patterns.