Skip to main content
. 2011 Nov 30;12(Suppl 3):S24. doi: 10.1186/1471-2164-12-S3-S24

Figure 5.

Figure 5

Venn diagrams illustrating the degree of overlap between the statistically significant probe sets identified by the Modified Wilcoxon test, with the corresponding probe sets identified by other methods (WT, t-test, PAM and EDGE). Panel A: Venn diagram illustrating the overlap between the MWT classifier and the top 2,829 differentially expressed probe sets, rank ordered using FDR values and identified using canonical approaches (t-test and WT with FDR correction). Panel B: Venn diagram depicting the overlap between the MWT classifier and the top ranked probe sets identified using computationally intensive feature selection methods.