Fig. 5.

Thickness and frequency dependent measurements of biased-voltages across LSMO/BFO heterointerfaces. (A) BFO thickness dependence of bias-voltages for BFO/LSMO heterostructures with both interface configurations. The bias-voltages were obtained with piezoresponse measurements. (B) Frequency dependent analysis biased-voltages of 150 nm BFO obtained from various measurement techniques. The frequencies of piezoresponse (d₃₃) and CV measurements were set to 0.02 and 0.05 Hz based on the total measurement time of about 50 and 20 s, respectively.