Skip to main content
. 2011 Oct 27;52(11):8420–8424. doi: 10.1167/iovs.11-7911

Figure 1.

Figure 1.

Creep testing by MII. (A) Spherical magnetic probe with radius R rested on the specimen before magnetic force was imposed. (B) During ramp loading, the reflective ferrous spherical probe was displaced by constant magnetic force. (C) While magnetic force was maintained on the indenter, displacement gradually increased as measured via interferometry over a 200-second duration.