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. 2012 Jun 22;68(Pt 7):751–756. doi: 10.1107/S1744309112020635

Table 1. X-ray data collection and phasing.

Values in parentheses are for the outer resolution shell.

  Native Peak Inflection High-energy remote
Data-collection statistics
Beamline X10SA, Swiss Light Source
Wavelength () 0.9999 0.9792 0.9794 0.9715
Detector Pilatus 6M
Crystal-to-detector distance (mm) 300 390
Rotation range per image () 0.5 0.2 0.2 0.2
Total rotation range () 180 120 100 100
Exposure time per image (s) 0.25 0.1 0.1 0.1
Attenuation (%) 85 90 90 90
Resolution () 2.0 (2.042.00) 2.40 (2.442.40) 2.70 (2.752.70) 2.70 (2.752.70)
Space group P212121
Unit-cell parameters () a = 35.88, b = 47.66, c = 126.57 a = 35.55, b = 46.91, c = 126.28 a = 35.61, b = 47.07, c = 126.63 a = 35.59, b = 47.42, c = 126.52
Mosaicity () 0.083 0.262 0.337 0.325
Total reflections 47725 37248 21856 21902
Unique reflections 15233 8808 5985 5979
Completeness (%) 98.7 (92.7) 99.7 (97.9) 95.0 (94.1) 95.1 (93.9)
Multiplicity 3.09 (3.15) 4.22 (4.35) 3.47 (3.36) 3.48 (3.39)
Mean I/(I) 9.15 (2.25) 10.85 (2.69) 10.55 (2.88) 11.81 (3.24)
R r.i.m. (%) 8.74 (35.55) 7.37 (29.73) 7.58 (27.77) 6.77 (24.69)
Substructure solution (SHELX)
d/sig   1.37 at 6.05.0 1.2 at 6.05.0 1.24 at 8.06.0
CCanom (8.0)   81.4 82.7 60.3
No. of sites 4
CC (all/weak) 47.69/38.88
PATFOM 42.45

R r.i.m. = Inline graphic Inline graphic, where N is the redundancy, Ii(hkl) is the ith observation of reflection hkl and I(hkl) is the weighted average intensity for all observations i of reflection hkl.