Table 1. Crystallographic data and data-collection statistics for LvAK.
Values in parentheses are for the highest resolution bin.
| X-ray source | NSLS X6A |
| Wavelength (Å) | 0.9795 |
| Space group | P212121 |
| Unit-cell parameters (Å) | a = 56.5, b = 70.2, c = 81.7 |
| Resolution range (Å) | 28.10–1.25 (1.28–1.25) |
| Total reflections | 654679 (47535) |
| Unique reflections | 91314 (6709) |
| R merge † | 0.054 (0.545) |
| R meas ‡ | 0.058 (0.588) |
| Completeness (%) | 100 (100) |
| 〈I/σ(I)〉 | 22.2 (3.9) |
| Multiplicity | 7.1 (7.0) |
| R work | 0.1584 |
| R free (5% of reflections) | 0.1968 |
| Mean B value (Å2) | 16.0 |
| B value from Wilson plot (Å2) | 16.4 |
| PDB code | 4am1 |
†
R
merge = 
, where Ii(hkl) and 〈I(hkl)〉 represent the diffraction-intensity values of the individual measurements and the corresponding mean values. The summation is over all unique measurements.
‡
R
meas is a redundancy-independent version of R
merge: R
meas = 
.