Figure 26.

Propagation length measurements with a slit-groove interferometer. (a) SEM of a single slit and a single groove milled with FIB through a 200 nm thick Ag film. (b) Propagation length measurements. The diamonds show l_tot measured from a template-stripped 200 nm thick silver film. The solid line depicts l_ohm calculated from ellipsometry data. Control measurements were also made on a rough as-deposited film for comparison (dots), along with previously reported data (squares)(van Wijngaarden, 2006). From (Nagpal, 2009) Reprinted with permission from AAAS.