Table 1.
Substrate |
j |
N |
f |
---|---|---|---|
(1015 cm−2 s−1) | (1015 cm−2) | ||
Glass |
2.00 ± 0.02 |
59.70 ± 3.0 |
0.59 ± 0.02 |
Si | 2.16 ± 0.02 | 28.9 ± 7.5 | 0.92 ±0.02 |
Obtained by NLSQ fitting of measured dependences of the mean layer thickness on the deposition time (see Figure 1).