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. 2012 Mar 15;19(Pt 3):359–365. doi: 10.1107/S090904951200235X

Figure 4.

Figure 4

Simulated η distribution for ENC = 340 and 390 e which correspond to the minimum and maximum noise values measured for the 20 µm-pitch strips. The Gaussian fits show a broadening of the lateral peaks with increased noise.