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. 2012 Aug 3;7(8):e42393. doi: 10.1371/journal.pone.0042393

Figure 2. Profilometer characterization of surface topography of the different samples.

Figure 2

Representative height maps in three-dimensional view of: a) uncoated titanium alloy disk, b) glass coated Ti4Al6V disk c) glass-nAg coated Ti4Al6V disk. Representative surface profiles exhibiting variations in Ra of: d) uncoated titanium alloy disk, e) glass coated Ti4Al6V disk and f) glass-nAg coated Ti4Al6V disk. The images correspond to 1 mm×1 mm scan area.