Figure 1.

SEM images of postprocessed magnets fabricated by a problematic batch fabrication approach, as outlined in Fig. 2 of Ref. 16. In this report, we will discuss an alternative method that significantly improves the magnet yield. (a) The integrated magnets of Ref. 16 overhang the leading edge of $200\text{-}\mu \text{m}$-long cantilevers. (b) Less than 1% of the fabricated magnets survived processing. Two common damage scenarios observed after processing were (c) complete magnet absence or (d) substantial magnet damage at the leading edge. The scale bar represents $20\mu \text{m}$ in (a) and 200 nm in (b)–(d).