Skip to main content
. 2011 May 10;29(3):032001. doi: 10.1116/1.3581102

Figure 4.

Figure 4

SEM images of the chip’s leading edge (left) and the corresponding magnified images of the associated magnets (right) produced by three release protocols: a chip with an overhanging nanomagnet, released prior to magnet deposition by a BOE wet etch [panels (a) and (b)]; a chip with an overhanging nanomagnet, released by HF vapor after magnet deposition [panels (c) and (d)]; and a chip with a nonoverhanging magnet, released prior magnet deposition with a BOE wet etch [panels (e)–(g)]. It can be seen in the inset in panel (d) that releasing with HF vapor damaged the magnet’s leading edge; the arrows highlight the leading 20 nm of the magnet in which only the chromium adhesion layer is intact. The magnet in panel (g) is coated with approximately 6 nm of alumina prepared by atomic layer deposition. The magnets in panels (b) and (f) are undamaged and uncapped. The scale bars in (a), (c), and (e) was 1μm. The scale bars in (b), (d), (f), and (g) was 200 nm.