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. Author manuscript; available in PMC: 2012 Nov 1.
Published in final edited form as: Opt Eng. 2012 Nov 1;51(11):111711. doi: 10.1117/1.OE.51.11.111711

Fig. 6.

Fig. 6

(a) Left: A flat-field broadband image from the IMS with varying facet image intensity. Right: A close-up of a flat-field narrowband facet image from the IMS, showing defocus of the facet. These design, fabrication, and assembly limitations cause intensity variations in the raw data. The superscript number corresponds to the system component in (b), which causes the problem. (c) A contrast-stretched image of nine facets after remapping shows overall and localized facet image nonuniformities. These flaws also translate to reduced resolution, missing data and/or geometric errors in the remapped datacube.