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. 2012 Aug 30;68(Pt 9):1070–1072. doi: 10.1107/S1744309112030886

Table 1. Diffraction statistics.

Values in parentheses are for the highest resolution shell. During the scaling process, a 0σ cutoff filter was applied.

X-ray source Beamline 26B1, SPring-8
Wavelength (Å) 1.000
Resolution (Å) 50.0–2.1 (2.13–2.10)
Space group P212121
Unit-cell parameters (Å) a = 121.1, b = 129.5, c = 131.3
Completeness (%) 89.0 (81.9)
R merge (%) 6.6 (39.6)
Multiplicity 5.2 (3.4)
Average I/σ(I) 12.6 (2.4)

R merge = Inline graphic Inline graphic, where Ii(hkl) and 〈I(hkl)〉 are the observed intensity and the mean intensity of related reflections, respectively.