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. 2012 May 30;12(6):7337–7349. doi: 10.3390/s120607337

Table 2.

The temperature-dependent parameters of the substrate and guide layers [11,19,20].

Materials Parameters X0 at reference temperature of T0 α1 (104) α2 (107)

Quartz c11(1011 N/m2) 0.8674 −0.443 −4.07
T0 = 20 °C c12(1011 N/m2) 0.0699 −29.3 72.45
c13(1011 N/m2) 0.1191 −4.92 −5.96
c14(1011 N/m2) −0.1791 0.98 −0.13
c33(1011 N/m2) 1.072 −1.88 −14.12
c44(1011 N/m2) 0.5794 −1.72 −2.25
c66(1011 N/m2) 0.3988 1.8 2.01
ρ(103 kg/m3) 2.65 −0.3492 −0.159
e11(C/m2) 0.171
e14(C/m2) 0.0403
ε11(10−11 F/m2) 3.997
ε33(10−11 F/m2) 4.103
α11(10−6 /°C) 13.71
α33(10−6 /°C) 7.48

SiO2 ρ(103 kg/m3) 2.2
T0 = 25 °C μ(1011 N/m2) 0.3121 1.4553
ε11(10−11 F/m2) 3.8265 0.2628

SU-8 ρ(103 kg/m3) 1.2152 −4.5142 1.3302
T0 = 25 °C μ(1011 N/m2) 0.011769 83.3139
ε11(10−11 F/m2) 2.6563 −37.757