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. 2012 Sep 24;7(9):e45254. doi: 10.1371/journal.pone.0045254

Figure 2. The calculated positions of channeled protons yield maxima.

Figure 2

Angular and spatial yield dependences correspond to area of reduced crystal thicknesses between 0.00 and 300.0, L = 1.69 µm (a) and 0.00 and 0.300, L = 99.2 nm (b), respectively. The chosen tilt angles relative to Si Inline graphic axis are φ = 0.05ψc, φ = 0.10ψc and φ = 0.15ψc.