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. 2012 Sep 4;109(38):15146-15151. doi: 10.1073/pnas.1207491109

Fig. 1.

Fig. 1.

Comparison of δ34S measurements of OS using three different analytical techniques. Histograms represent the δ34S values of four kerogen standards that were measured by EA-IRMS, by magnetic sector SIMS (IMS 7f), and by nanoscale SIMS (NanoSIMS). These analyses demonstrate that the accuracy of the IMS-7f and NanoSIMS is comparable to that of IRMS, a technique that allows better precision but has a spatial resolution limited to bulk samples.