. 2012 Jul 1;7(1):357. doi: 10.1186/1556-276X-7-357
Copyright ©2012 Ghraïri and Bouaïcha; licensee Springer.
This is an Open Access article distributed under the terms of the Creative Commons Attribution License (http://creativecommons.org/licenses/by/2.0), which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.
Figure 3.
AFM images.(a) Elaborated TiO2 layer and (b) FTO thin film.