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. Author manuscript; available in PMC: 2013 Aug 29.
Published in final edited form as: J Am Chem Soc. 2012 Aug 20;134(34):13918–13921. doi: 10.1021/ja300984b

Figure 6.

Figure 6

Detecting assembly defects using CHA circuits. In the perfectly formed mAP structure (a), the toehold (shown in red) is only partially exposed, whereas defects near the hybridization junction may fully expose the toehold (b). The hybridization defects can be mimicked by introducing point mutations on the mOS strand, which stimulate the activity of mAP to different extent (c). T18A* (Sample #7) denotes 1:5-diluted T18A variant of mOS.