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. 2012 Oct 11;2:726. doi: 10.1038/srep00726

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(a) Low-magnification TEM image, (b) Selected area electron diffraction pattern, (c) High-resolution TEM (HRTEM) image of a BST flake on a holey carbon grid, respectively. The sharp SAED pattern in (b) indicates the high-quality single crystal. The HRTEM image in (c) reveals a perfect crystalline structure and the spacing between the atomic planes is resolved to be 0.22 nm (marked by a pair of parallel lines). (d) Layered crystal structure of Bi₂Se₃ and Bi₂Se₂Te, showing the disordered occupation of Se/Te atoms in outer quintuple layers. Scale bars in (a) is 2 μm.

Inline graphic — (a) Low-magnification TEM image, (b) Selected area electron diffraction pattern, (c) High-resolution TEM (HRTEM) image of a BST flake on a holey carbon grid, respectively. The sharp SAED pattern in (b) indicates the high-quality single crystal. The HRTEM image in (c) reveals a perfect crystalline structure and the spacing between the atomic planes is resolved to be 0.22 nm (marked by a pair of parallel lines). (d) Layered crystal structure of Bi₂Se₃ and Bi₂Se₂Te, showing the disordered occupation of Se/Te atoms in outer quintuple layers. Scale bars in (a) is 2 μm.