Table 1.
Main characteristics of the four SPECT-CT systems used in the study
|
Name |
SPECT detector |
NEMA spatial resolutionawith LEHR collimator (mm) |
CTb |
|||
|---|---|---|---|---|---|---|
| |
|
Planar |
SPECT Central |
SPECT Peripheral |
|
|
| Radial | Tangential | |||||
| General Electric Discovery NM/CT 670 |
3/8 in. NaI crystal |
7.4 |
≤9.9 |
≤9.9 |
≤7.5 |
80, 100, 120, and 140 kV |
| 59 PMT |
10 to 440 (100) mA |
|||||
| 1 ADC/PMT |
0.5, 0.6, 1.0, and 1.5 s rotation time (in spiral mode) |
|||||
| 40 × 54 cm FOV |
24 rows - maximum 16 slices/rotation |
|||||
| General Electric Infinia Hawkeye 4 |
3/8 in. NaI crystal |
7.4 |
≤9.9 |
≤9.9 |
≤7.5 |
120 and 140 kV |
| 59 PMT |
1.0, 1.5, 2.0, and 2.5 mA |
|||||
| 1 ADC/PMT |
2.0 or 2.6 rpm gantry rotation |
|||||
| 40 × 54 cm FOV |
4 rows - 4 slices per rotation |
|||||
| Philips Brightview XCT |
3/8 in. NaI crystal |
7.4 |
≤10.3 |
≤10.5 |
≤9.0 |
120 kV |
| 59 PM |
2.5, 5, 10, 15, and 20 mA |
|||||
| 1 ADC/PMT |
12 s (fast) and 60 s (slow) rotation times |
|||||
| 40.6 × 54 cm FOV |
CsI flat panel 14 cm axial FOV detector |
|||||
| Siemens Symbia T series | 3/8 in. NaI crystal |
7.4 | ≤11.4 | ≤11.7 | ≤8.4 | 80, 110, and 130 kV |
| 59 PMT |
T2: 30 to 240 (100) mA; 0.8, 1.0, 1.5 s rotation time; 2 rows - 2 slices/rotation |
|||||
| 38.7 × 53.3 cm FOV | ||||||
|
T6: 20–345 (100) mA; 0.6, 0.8, 1.0, 1.5 s rotation time; 16 rows - maximum 6 slices/rotation | ||||||
| T16: 20 to 345 mA; 0.5, 0.6, 1.0, and 1.5 s rotation time; 24 rows - maximum 16 slices/rotation |
aFull width at half maximum (at 100 mm for planar, with 15 cm rotation radius for SPECT) without scatter; bunderlined values are values used in this study. ADC, analog to digital converter; CT, computed tomography; FOV, field of view; NEMA, National Electrical Manufacturers Association, PMT, photomultiplier tube; SPECT, single-photon emission computed tomography.