TABLE I.
Elemental composition from XPS survey spectra for ppTTg plasma polymer coatings on Si wafers and PDMS substrates. All values represent the mean elemental composition percentage + SD, calculated from 6 replicates for each sample.
| Sample | %C | %O | %Si | O/C Ratio |
|---|---|---|---|---|
| Native PDMS | 45.5 ± 0.7 | 26.6 ± 1.0 | 27.9 ± 0.7 | 0.58 ± 0.01 |
| Single ppTTg coated PDMS | 65.8 ± 3.3 | 28.2 ± 1.8 | 6.0 ± 1.7 | 0.43 ± 0.02 |
| Double ppTTg coated PDMS | 68.2 ± 1.4 | 29.9 ± 1.6 | 1.9 ± 0.2 | 0.45 ± 0.02 |
| ppTTg coated silicon wafer | 67.5 ± 1.0 | 32.5 ± 1.5 | 0 | 0.48 ± 0.02 |
| Theoretical composition of tetraglyme | 66.7 | 33.3 | 0 | 0.5 |