TABLE III.
XPS elemental composition of survey spectra and ether carbon content after various aging time points. All values are percentage values to two decimal points and represent the mean percentage calculated from 3 replicates for each sample.
| Sample | Day | %C | %O | %Si | O/C | % C-O |
|---|---|---|---|---|---|---|
| ppTTg coated Si wafer | 0 | 67.5 | 32.5 | 0 | 0.48 | 81.9 |
| 10 | 67.9 | 32.1 | 0 | 0.47 | 80.5 | |
| 100 | 68.7 | 31.3 | 0 | 0.45 | 79.8 | |
| Single ppTTg coated PDMS | 0 | 65.8 | 28.2 | 6.0 | 0.43 | 65.1 |
| 10 | 60.4 | 30.1 | 9.5 | 0.51 | 57.4 | |
| 100 | 57.7 | 30.8 | 11.4 | 0.58 | 51.7 | |
| Double ppTTg coated PDMS | 0 | 68.2 | 29.9 | 1.9 | 0.45 | 79.5 |
| 10 | 69.1 | 28.5 | 2.4 | 0.41 | 77.4 | |
| 100 | 66.2 | 30.7 | 3.1 | 0.46 | 77.2 | |
| Native PDMS | 0 | 45.5 | 26.6 | 27.9 | 0.58 | 0 |
| 10 | 46.3 | 26.3 | 27.4 | 0.57 | 0 | |
| 100 | 47.9 | 27.0 | 25.1 | 0.56 | 0 |