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. 2012 Jun 28;42(3):144–154. doi: 10.4041/kjod.2012.42.3.144

Figure 7.

Figure 7

Posttreatment and 2- year retention cephalometric analyses. Lateral cephalometric tracings at posttreatment (dotted line) and 2-year retention (double dotted line) superimposed on the pretreatment tracings (solid line) on the Sella-Nasion plane at Sella (A); on the palatal plane at Ptm' (B); and on the mandibular plane at Menton (C). Cephalometric measurements before treatment (solid line), after (dotted line) treatment, and at 2-year retention (double dotted line) (D). SNA, Sella-Nasion-A point angle; SNB, Sella-Nasion-B point angle; ANB, A point-Nasion-B point angle; GoA, Gonial angle; FMA, Frankfort-mandibular angle; IMPA, Incisor-mandibular plane angle; FMIA, Frankfort-mandibular incisor angle; U1-FH, Axial inclination of the upper central incisor in relation to Frankfort plane; Y-axis, Angle between Frankfort plane and Sella-Gnathion line; Interincisal A, angle between the axial inclinations of the upper and lower central incisors; Ramus height, Length of the mandibular ramus (Articulare-Gonion); Me to palatal pl., Lower anterior facial height (Menton to palatal plane). SD, Standard deviation.