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. 2012 Jun 12;20(13):14284–14291. doi: 10.1364/OE.20.014284

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©2012 Optical Society of America

This is an open-access article distributed under the terms of the Creative Commons Attribution-Noncommercial-No Derivative Works 3.0 Unported License, which permits download and redistribution, provided that the original work is properly cited. This license restricts the article from being modified or used commercially.

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Fig. 4 — Defect away from the surface of the film was healed in the self-images of the hole array pattern. The light patterns at (A) the film surface z = 0 μm, (B) the position of the particles z = 11.2 μm(C) the self-image planes at z = 13.5 μm and (D) the self-image planes at z = 29 μm. (E) yz cross-section of the 3D light pattern showed the particle had a very local influence on the light pattern. (a₀ = 1.2 μm, λ = 543 nm, n = 1.4)