Table 1. Data collection and processing statistics for TaV RdRP crystals.
Numbers in parentheses refer to the highest resolution shell.
| Parameters | Native crystal | Derivative crystal |
|---|---|---|
| λ (Å) | 0.98 | 1.3404 |
| Space group | P21212 | C2221 |
| Unit-cell parameters (Å) | a = 134.97, b = 150.82, c = 100.61 | a = 154.05, b = 224.57, c = 128.29 |
| Resolution range (Å) | 30.0–2.15 (2.27–2.15) | 63.52–3.0 (3.16–3.00) |
| Total reflections | 503448 | 285828 |
| Beamline | ID14.4 (ESRF) | ID23.1 (ESRF) |
| Unique reflections | 109020 (15398) | 44236 (6247) |
| Multiplicity | 4.6 (3.0) | 6.5 (5.9) |
| Completeness (%) | 97.5 (95.6) | 98.7 (96.5) |
| R merge (%)† | 12.0 (29.4) | 11.6 (37.9) |
| I/σ(I) | 9.0 (4.1) | 13.3 (4.5) |
| f′ | −24.87 | |
| f″ | 34.98 |
†
R
merge = 
, where I(hkl) is the observed intensity and 〈I(hkl)〉 is the weighted average intensity of multiple observations of symmetry-related reflections.