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. 2012 Oct 16;3:401. doi: 10.3389/fpsyg.2012.00401

Figure 5.

Figure 5

ERP correlates of a reduction of memory strength with repeated suppression attempts for no-think items (top row) and think items (bottom row). (A) ERPs at electrode Fz from the three parts (block I, II, III) of the think/no-think phase. Negative polarity is plotted upwards. (B) Topographical difference between ERPs from the first (block-I) and the last part (block-III) of the think/no-think phase.