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. 2012 Apr 5;20(8):9203–9214. doi: 10.1364/OE.20.009203

Fig. 6.

Fig. 6

Rt-SESF imaging of 3D structures of the multilayered nanosphere aggregates at four distinct diameters. (a), (b) Illustration of the configuration of the nanosphere aggregates. (c) Conventional bright field images. (d), (e) Rt-SESF images and Fourier plane images respectively. (f) Axial spatial periods for the averaged dominant structure of each sample. (g) Distribution of axial spatial period along the lateral direction in the Fourier plane. (h) The dependence of the wavelength on the backscattering angle for the axial structure (axial spatial frequency 3333 1/mm) and lateral structure (lateral spatial frequency 1000 1/mm).