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. 2012 Nov 28;68(Pt 12):1571–1576. doi: 10.1107/S1744309112045563

Table 1. Data-collection, processing and refinement statistics.

Values in parentheses are for the highest resolution shell.

Wavelength (Å) 0.9186
No. of images 392
Space group P21
Unit-cell parameters (Å, °) a = 255.4, b = 350.4, c = 271.6, β = 90.34
Resolution (Å) 50–2.7 (2.8–2.7)
Total No. of reflections 16673125
No. of unique reflections 1210268 (123000)
Crystal mosaicity (°) 0.3–0.5
Completeness (%) 93.1 (94.7)
R merge (%) 13.2 (37.8)
Multiplicity 2.6 (2.4)
I/σ(I)〉 6.9 (2.4)
V M3 Da−1) 2.1
R factor/R free § (%) 23.9/23.9

R merge = Inline graphic Inline graphic × 100, where Ii(hkl) is the intensity of an individual reflection with indices hkl and 〈I(hkl)〉 is the average intensity of all symmetry-equivalent measurements of that reflection; the summation is over all intensities.

R factor = Inline graphic Inline graphic × 100, where F obs and F calc are the observed and calculated structure-factor amplitudes, respectively.

§

R free is calculated in the same way as the R factor, except that it uses 5% of the reflection data partitioned from the refinement process.