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. 2012 Dec 5;103(11):2361–2368. doi: 10.1016/j.bpj.2012.10.035

Figure 5.

Figure 5

Fraction of native contacts between various structural elements of GB1 derived from SMD simulations. Columns 1 to 7 contain the fraction of intact native contacts between various structural elements during the stretching process: side-chain contacts between N- and C-terminal β-hairpins (N+C hairpin), side-chain contacts between N-terminal β-hairpin and α-helix (N h.p.+helix), side-chain contacts between C-terminal β-hairpin and α-helix (C h.p.+helix), backbone contacts between N- and C-terminal β-hairpins (N+C hairpin), backbone contacts within N-terminal β-hairpin (N hairpin), backbone contacts within C-terminal β-hairpin (C hairpin), and backbone contacts within the α-helix (helix). Gray traces are derived from 10 individual SMD simulations and the black trace is the average of them.