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. 2012 Nov 16;12(11):15873–15887. doi: 10.3390/s121115873

Figure 7.

Figure 7.

Experimental signal-to-noise ratio (S/Nexp) of 2G-MSS (red solid line), 1G-MSS (red dashed line), the optical cantilever (black solid line), and the piezoresistive cantilever (black dashed line) as a function of the induced surface stress. The experimental noises (Nexp); 1.0 μV and 1 nm for piezoresistive and optical read-outs, respectively.