Figure 7.
Experimental signal-to-noise ratio (S/Nexp) of 2G-MSS (red solid line), 1G-MSS (red dashed line), the optical cantilever (black solid line), and the piezoresistive cantilever (black dashed line) as a function of the induced surface stress. The experimental noises (Nexp); 1.0 μV and 1 nm for piezoresistive and optical read-outs, respectively.