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. 2011 Dec 8;13(1):66–73. doi: 10.1002/cphc.201100738

Figure 5.

Figure 5

Atomic force microscopic surface profiles at approximately the same location on a ZnO:Al film after 400 s of etching in KOH (—) followed by 5 (—), 10 (—), and 20 (—) cumulative seconds in HCl. The original film thickness is indicated by a strait bold line (—).