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. 2012 Dec 15;69(Pt 1):35–38. doi: 10.1107/S1744309112049184

Table 2. Data-collection and processing statistics.

Values in parentheses are for the highest resolution shell.

    E2tr N298Q
  Native E2 High resolution Peak Inflection Remote
Beamline I24 I02 I03 I03 I03
Space group P21212 C2 C2 C2 C2
Unit-cell parameters (Å, °) a = 160.7, b = 49.7, c = 136.4 a = 132.2, b = 47.6, c = 159.3, β = 108.2 a = 133.2, b = 47.8, c = 154.7, β = 110.8 a = 133.2, b = 47.8, c = 154.7, β = 110.8 a = 133.2, b = 47.8, c = 154.7, β = 110.8
Wavelength (Å) 1.0341 0.9796 0.9794 0.9796 0.9686
Resolution (Å) 50–3.3 50–2.6 50–3.1 50–3.4 50–3.3
No. of unique reflections 17239 (1659) 29885 (2320) 16339 (1075) 13221 (545) 14284 (348)
No. of observed reflections 83948 148705 131000 42235 45314
Completeness (%) 99.9 (99.8) 97.0 (76.1) 96.2 (63.3) 99.9 (100) 99.9 (100)
Multiplicity 4.9 (4.8) 5 (4.5) 8 (2.7) 3.2 (1.9) 3.2 (1.9)
I/σ(I)〉 6.6 (1.5) 15.1 (1.7) 17.9 (2.1) 12.1 (2.0) 12.4 (2.1)
R merge (%) 24.2 (92.2) 11.0 (100) 12.1 (27.6) 11.3 (24.7) 11.6 (23.3)

R merge = Inline graphic Inline graphic, where I i(hkl) is the ith measurement and 〈I(hkl)〉 is the weighted average of all measured reflections.