Figure 5. The LCOM performance affected by interface properties.

(a) Current decay test of LCOMs with the annealed M-C10 film, non-annealed M-C10 film and M-C0 film as the memory layer after the same dose of light exposure. For annealed M-C10 memory layer, the current decreased to 92% of the initial level after storage for 20000 s; the current decayed to 25% and 18% of the initial values, respectively, for non-annealed M-C10 and M-C0 memory layers. The background transfer curve shifts when a writing voltage of 35 V was applied to the device for 60 s in dark for (b) Annealed M-C10 memory layer. (c) Non-annealed M-C10 memory layer. (d) M-C0 memory layer. The background current density in dark was significantly reduced from 3.03 nA cm⁻² to 0.175 nA cm⁻² after the alkyl side chain self-organization at the interface of pentacene/M-C10.