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. Author manuscript; available in PMC: 2013 Jan 17.

Published in final edited form as: Angew Chem Int Ed Engl. 2009;48(42):7787–7791. doi: 10.1002/anie.200903380

A). Schematic of a fcc crystal with a twin plane (Twin) and stacking faults (SF) along the {111} planes. B and C). High-resolution TEM images of a seed (6B, scale bar 2 nm) and a small bipyramid (6C, scale bar 4 nm; inset: zoom out view of this bipyramid, scale bar, 20 nm) showing multiple planar twinned planes along with stacking faults when the reaction was stopped after one hour and two hours, respectively (excitation wavelength 550±20 nm).

A). Schematic of a fcc crystal with a twin plane (Twin) and stacking faults (SF) along the {111} planes. B and C). High-resolution TEM images of a seed (6B, scale bar 2 nm) and a small bipyramid (6C, scale bar 4 nm; inset: zoom out view of this bipyramid, scale bar, 20 nm) showing multiple planar twinned planes along with stacking faults when the reaction was stopped after one hour and two hours, respectively (excitation wavelength 550±20 nm).