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. 2013 Jan 17;8:307–314. doi: 10.2147/IJN.S35245

Figure 5.

Figure 5

AFM analysis on titanium disks with 10 × 10 μm section: (A) reference titanium plate, (B) titanium plate treated with F-based mouthwash, (C) titanium plate treated with CHA-based mouthwash.

Abbreviations: AFM, atomic force microscopy; CHA, carbonate–hydroxyapatite; F, fluoride.