Table 2.

AFM analysis of different titanium disks, 100 × 100 μm section

100 × 100 μm	Root mean square (Rq)	Highest peak (Rp)	Deepest valley (Rv)
Polished titanium disk (reference)	280 nm	700 nm	−740 nm
F−-based mouthwash treated disk	460 nm	840 nm	−940 nm
CHA-based mouthwash treated disk	235 nm	620 nm	−520 nm

Abbreviations: AFM, atomic force microscopy; CHA, carbonate–hydroxyapatite; F⁻, fluoride.