Figure 2.

(a) Energy loss as a function of specific ion energy. The dashed lines separate the different regimes of track etching: homogenous (full symbols), inhomogeneous (crossed symbols), and absence of etching (open). (b) SEM images of uniform pores resulting from homogeneous tracks (top) and pores with broad size distribution due to inhomogeneous tracks (bottom). Adapted with permission from [38] – Copyright 1996 Elsevier.