Skip to main content
. 2013 Jan 24;4(2):322–330. doi: 10.1364/BOE.4.000322

Fig. 4.

Fig. 4

Instrument resolution. (a) En-face (XY-plane) reflectance image of a standard target shows lateral resolution of 4 μm, FOV 400 × 400 µm2, scale bar 50 μm. (b) Axial scan from a reflective target shows FWHM of 5 μm at depth of 250 μm in a scattering-free deionized-water film.