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. 2013 Mar;87(5):2949–2955. doi: 10.1128/JVI.03163-12

Table 1.

Data collection and refinement statisticsa

Statistic Value for TGEV nsp1
Data collection Native Pt
    Beamline ID23eh2 (ESRF) ID14eh4 (ESRF)
    Wavelength (Å) 0.873 1.072
    Space group P1 P1
    Cell axial lengths (Å) 35.4, 36.0, 42.2 35.6 36.1 42.7
    Cell angles (°) 91.3, 109.1, 94.2 90.9, 109.4, 93.9
    Resolution range (Å) 27.4–1.5 (1.58–1.50) 40.3–2.5 (2.64–2.5)
    No. of reflections measured 122,299 (17,500) 167,992 (24,887)
    No. of unique reflections 30,811 (4,441) 6,888 (9,98)
    Avg multiplicity 4.0 (3.9) 24.4 (24.9)
    Anomalous avg multiplicity 12.0 (12.3)
    Completeness (%) 96.6 (95.4) 99.6 (99.8)
    Anomalous completeness (%) 99.4 (99.8)
    Rmerge 0.056 (0.476) 0.079 (0.263)
    〈II 14.3 (3.0) 45.5 (19.7)
Refinement
    Resolution range (Å) 26.1–1.5
    No. of reflections used in working set 31,262
    No. of reflections for Rfree calculation 1,535
    R (%) 17.5
    Rfree (%) 20.9
    No. of nonhydrogen atoms 1,718
    No. of solvent waters 207
    Mean B factor (Å2) 23.3
    Ramachandran plot outliers (%)b 0.0
    RMSD from ideal bond length (Å)c 0.01
    RMSD from ideal bond angle (°)b 1.06
a

Values in parentheses refer to the outer resolution shell. Data collection statistics were calculated using Scala, part of the CCP4 software program suite (30, 31). Refinement statistics, except for Ramachandran outliers, were calculated using Buster-TNT (39).

b

Calculated using a strict-boundary Ramachandran plot definition (51).

c

Root mean square deviation; ideal values from Engh and Huber (52).