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. 2013 Feb 20;8(2):e57335. doi: 10.1371/journal.pone.0057335

Figure 3. Transmission electron microscopy analysis of the IONs.

Figure 3

(A) Typical TEM micrograph of the IONs; inset shows occasional presence of a subset of particles with a smaller diameter (arrows). (B) Size distribution profile of the IONs obtained from TEM analysis of 400 nanoparticles. (C) Selected area electron diffraction (SAED) pattern acquired from IONs.